System Architecture

System Architecture and Data Flow

This architecture stores wafer test data, final test data, and metadata collected from testers and upstream systems, then enables high-speed analysis and visualization on the client side.

KAI_Analysis_Server_System: overall architecture including parsers, analysis engine, database, analysis rules, alarm notifications, and client integration
Overview of integration between semiconductor test systems, MES, KAI Analysis Server, and KAI Analysis Tool

Server: Collection, Storage, and Integration

KAI_Analysis_Server_System collects data from testers, probers, handlers, MES, and other upstream systems, then stores it in the database after validation, formatting, and missing-data handling.

Client: Analysis and Visualization

KAI_Analysis_Tool_Client retrieves large volumes of data from the database at high speed and performs analysis and visualization. It also supports standalone analysis by directly reading test data files such as STDF.

Data Flow

Collection → preprocessing → database storage with sharding → analysis including statistics, correlation, spatial, and time-series analysis → visualization using maps, distributions, and control charts → notification → upstream system integration → archive/delete.

Alarms and Upstream Integration

Alert notifications upon anomaly detection and transmission of analysis results to upstream systems help accelerate feedback to processes and equipment.