System architecture: overall structure of Server, Client, DB, Parser, and alarm notificationsKAI analysis system overview: integration between test systems, MES, analysis server, and analysis tool2D correlation analysis: review outliers using upper and lower specification limits and scatter plotsWafer map gallery: display spatial distributions across multiple wafersHistogram gallery: compare measurement distributions by waferQQ plot gallery: review distribution shifts and outlier tendenciesPass/Fail map gallery: visualize pass/fail distributions by waferXbar-R control chart: monitor process variation and equipment drift over timeWafer control chart: analyze region split results over timeWafer region split methods: four area split methods and target evaluation dataArea split and PF map: review spatial trends in yield and Pass/Fail resultsCategory map and value map: display chip-level categories and test values
